Reflection defined

The most fundamental reflectivity defines the intensity reflected into a particular direction resulting from energy incident from a given direction. At a particular wavelength, this is as follows. 

By integrating over all wavelengths, the reflectivities defined above become total values and are given as follows. 

The excess conductivity of a semiconductor, Acr= ejj. i,fAn(p), due to the induced change in carrier concentration n(p) results in a corresponding change of the reflected microwave intensity APr. With the relative microwave reflectivity defined as... 

One of the optical properties used in X-ray analysis is total reflection of X-rays at an optically flat surface. This phenomenon occurs when photons impinge on a surface below the critical angle 6c of total reflection. Defined in practical units 6c (in minutes of arc) can be expressed as a function of atomic number Z ... 

When a crystal is. placed on an X-ray goniometer and rotated in the X-ray beam, the intensity of reflection rises to a maximum and then falls away. The more ideal the crystal the sharper is this sweep curve . Calculations have been made of the angular breadth of the sweep curve for an ideal crystal, which show that only a few seconds of arc will cover the whole breadth of the curve. Analogous calculations for a mosaic crystal indicated a much greater angular breadth of the sweep curve , which may amount in extreme cases to several degrees. In Table 78 (15) are illustrated the observed breadths of sweep curves at their points of half intensity and also values of the integrated reflection defined as... 

For the starting phase set, select the reflections defining the origin and a few additional reflections... 

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