Regular configuration, recombination layers

Figure 11.2 Schematic representations of the regular and inverted device layouts for series-connected organic tandem cells. Under operation the indium tin oxide (ITO) electrode is biased positive with respect to the metal electrode in the regular configuration and negative in the inverted configuration. The difference is caused hy the positioning of the hole and electron collecting layers (HCL and ECL) with respect to photoactive layers. The intermediate contact formed hy HCL and ECL is referred to as the recombination layer. Note that in practice the device layout may vary from these schematics.

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