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Quasi-static simple sampling

The AFM probe tip interacts via various mechanisms with the sample surface, including simple quasi-static and dynamic normal and lateral forces. These (and other) interactions depend on local physical properties of the sample, on the scale of the probed area. Tribological, viscoelastic, and microhardness mechanical properties can be probed under (more or less) controlled environmental conditions. [Pg.255]


See other pages where Quasi-static simple sampling is mentioned: [Pg.73]    [Pg.74]    [Pg.73]    [Pg.74]    [Pg.201]    [Pg.202]    [Pg.50]    [Pg.73]    [Pg.850]    [Pg.857]    [Pg.1036]    [Pg.318]   


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Simple sampling

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