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Quantitative reliability metric

Harrington and Isenhour developed a quantitative reliability metric (QRM) for determining the reliability of library searching methods with infrared spectra. They report applying the metric for evaluating the reliability of library searches for unknown target spectra and using the measure for de-... [Pg.187]

The reliability of an interconnection is determined by the accumulation of deformation in the solder. Several theoretical approaches have been proposed to quantitatively describe the accumulation of deformation during the creep-fatigue process. Those theories range from empirical approaches based upon such metrics as... [Pg.79]

See other pages where Quantitative reliability metric is mentioned: [Pg.582]    [Pg.518]    [Pg.28]    [Pg.99]    [Pg.157]    [Pg.342]    [Pg.8]    [Pg.13]    [Pg.85]    [Pg.559]    [Pg.42]    [Pg.291]    [Pg.312]    [Pg.77]    [Pg.99]    [Pg.51]   
See also in sourсe #XX -- [ Pg.187 ]



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