Quantification of the crystallographic orientation studying texture

Quantitative texture studies are conducted with the specific instruments we described in Part 1. Chapter 4 dealt with the traditional apphcations of diffiraction on polycrystalline samples and not with quantitative texture study. It is clear, however, that this kind of measurement, which involves polycrystalhne materials in general, whether in the form of films or not, is an important and very old application [KNI 13] of X-ray diffraction. We have decided, however, not to deal with this particular field, since other books are available that discuss it in detail [BUN 82, BUN 99]. 

Regardless of what type of sample or instrument is used, the results of the measurements are usually given in the form of pole figures. Without going into detail, we will describe these figures and explain how they can be drawn. 

The pole of a crystal plane with indices (hkl) is the intersection of the normal with that plane that passes through the point C and a sphere, centered in C, and with an arbitrary diameter. 

5 Of course, the reverse situation is true for a point located on the southern hemisphere. 

As we have already mentioned, this description of quantitative texture measurements based on pole figures involves both bulky samples and thin films. The experimental conditions may differ in order to optimize the diffracting volumes, but this has already been discussed in Part 1 of this book. We will not go into any further detail on the study of textured films since, most of the time, it can all be reduced to the general case of quantitative texture analysis. 

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