Quality Objectives for Single-Particle ICP-MS Studies

Data Quality Objectives for Single-Particle ICP-MS Studies 

It is clear that the analytical demands put on ICP-MS are probably higher than any other trace element technique because it is continually being asked to solve a wide variety of application problems at increasingly lower levels. However, by optimizing the measurement protocol to fit the analytical requirement, ICP-MS has shown that it has the unique capability to carry out rapid trace element analysis with superb detection limits and good precision on both continuous and transient signals and still meet the most stringent data quality objectives. 

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