Polystyrene SIMS spectrum

Figure 1 shows a positive static SIMS spectrum (obtained using a quadrupole) for polyethylene over the mass range 0—200 amu. The data are plotted as secondary ion intensity on a linear y-axis as a function of their chaige-to-mass ratios (amu). This spectrum can be compared to a similar analysis from polystyrene seen in Figure 2. One can note easily the differences in fragmentation patterns between the...

The SIMS spectrum of a 0.5 mm thick film of polystyrene cast on silver is shown in Figure 8. The characteristic ions, phenyl-type (m/z 77, 78, 79), benzyl (m/z 91), and protonated styrene (m/z 105) along with higher m/z ions resembling those from pyrolysis studies, are observed. 

Figure 8. SIMS spectrum of a 0.5 mm thick insulating film of polystyrene cast on silver. Reproduced with permission from Ref. 116. Copyright 1983, Elsevier Science Publishing Co.

Figure 8.14 Positive ion ToF SIMS spectrum of polystyrene. (Reproduced with permission from D. Briggs, Surface Analysis of Polymer by XPS and Static SIMS, Cambridge University Press, Cambridge, UK. 1998 Cambridge University Press.)...

Try to determine the ions in the negative SIMS spectrum of polystyrene in Figure 8.15. 

Figure 3.20. The time-of-flight SIMS spectrum of a polystyrene oligomer whose number average relative molecular mass is 4964, deposited as a thin film on a silver substrate. After Bletsos et al. (1987).

Fig. 9. Part of the positive ion ToF-SIMS spectrum from a polystyrene film sample. The most intense peaks (mostly expanded off scale) are Cj Hy+ fragments from the polsmier. The presence of zinc is revealed by the the mass resolved peaks at below unit mass representing the Zn" " isotopes at nominal m/z 64 (47%), 66 (28%), and 68 (19%) together with an equivalent pattern for ZnH+. Reproduced from Ref 3, by permission of Cambridge University Press.

Fig. 1. (A) Positive S-SIMS spectrum of Fmoc-Met(0)2-Ala-Val anchored to Wang resin immonium ion of valine at m/z 72, Fmoc protection at m/z 165/178/179, polystyrene at m/z 77/91/115 (B) Negative S-SIMS spectrum of Fmoc-Met(02)-Val-Ala anchored to Wang resin carboxylate ion H-Met(02)-Val-Ala-0 at m/z 350.

Figure 5.3 Part of ToF-SIMS spectrum of polystyrene cationised with Ag+...

Figure 2.12 illustrates the mass spectrum of a narrow-dispersed polystyrene sample recorded using a Secondary Ion Mass Spectrometer equipped with a time-of-flight detector (TOF-SIMS). There are a series of mass spectral peaks due to ions of the type H-(St) -C4H9, Ag (silver was added as a cationization agent). Equahon (2.1) yielded Mn = 4550, which is within 8% with the value Mn = 4964 obtained by VPO. 

TOF-SIMS mass spectrum of a polystyrene sample (reproduced with permission from Ref. 35). 

Fig. 5.11 An ion attachment mass spectrum and selected ion monitoring (SIM) of the CRM sample (No. 8, decaBDE of 3900 ppm in polystyrene resin), a SIM for m/z 966, b SIM for m/z 978, and c reconstructed mass spectrum for the retention time period of 13 min. (Reprinted with permission from [177]. 2010, Royal Society of Chemistry)...

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