Photoelectron Shirley background subtraction

The electronic structure of nanopowders was explored by method of X-ray photoelectron spectroscopy (XPS) by electronic spectrometer ES-2404 with PHOIBOS-IOO SPECS energy analyzer (E MgK(x-1253.6 eV, P-200 W, P=210 7 Pa). The spectrometer is equipped with an ion gun IQE-11/35 and a flood gun FG 15/40 for sample charge neutralization. The spectra of W4f7/2-level were factorized into component couples with parameters AEp (4f5/2 - 4f7/2) =2.1 eV, I4B/2/ Ln/2 = 0.77. The spectra of Ols-level were factorized into separate components. The factorization was carried out by Gauss-Newton method. The areas of components were determined after subtraction of background by Shirley method [1]. 

X-ray Photoelectron Spectroscopy. Spectra of powdered samples were recorded on a VG Microtech XP Spectrometer equipped with a Clam II hemispherical analyzer, using a Mg-source (1253.6 eV) operated at 10 mA. To calculate peak areas, backgrounds were subtracted according to a procedure suggested by Shirley [12]. 

XPS measurements were carried out on an AXIS NOVA photoelectron spectrometer (Kratos Analytical, Manchester, UK). The surface atomic concentration was determined firom peak areas using sensitivity factors. Spectrum background was subtracted according to Shirley. The XPS peaks of the Ti species were analyzed by spectra deconvolution software (CasaXPS-Vision 2, Kratos Analytical, UK). 

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