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Photocapacitance techniques

Several methods not based on DLTS have also been described. White et al. (1976) present a two-light source, scanned photocapacitance technique that yields a spectrum of the deep states in the depletion region of a junction. The method is fast and sensitive, but most useful as a survey technique because knowledge of the dependence of the photoionization cross section on photon energy is required to obtain accurate trap depths. [Pg.18]

The migration of Fe during low-temperature aimealing was studied by using photocapacitance techniques. The resultant depth profiles revealed the occurrence of Fe out-diffusion, but no precipitation in the bulk, at up to 470K. The Fej diffusion... [Pg.83]

The optical absorption arising from the defect transitions is weak because of the low defect densities and in a thin film cannot be measured by optical transmission. The techniques of PDS, CPM and photoemission yield, described in Section 3.3, have sufficient sensitivity. Photocapacitance, which measures the light-induced change in the depletion layer capacitance, is similarly sensitive to weak absorption (Johnson and Biegelsen 1985). PDS measures the heat absorbed in the sample and detects all of the possible optical transitions. At room temperature virtually all the recombination is non-radiative and generates heat by phonon emission. CPM detects photocarriers and so is primarily sensitive to the optical transitions which excite electrons to... [Pg.123]


See other pages where Photocapacitance techniques is mentioned: [Pg.18]    [Pg.141]    [Pg.18]    [Pg.141]    [Pg.211]    [Pg.7]    [Pg.124]    [Pg.219]    [Pg.232]   
See also in sourсe #XX -- [ Pg.18 ]




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Photocapacitance

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