Partial electron yield mode

NEXAFS experiments were carried out at the National Synchrotron Light Source (NSLS), Brookhaven National Lab (New York), on Exxon Beamline U1A in the partial electron yield mode for various irradiation angles between normal and grazing incidence. To compensate for the severe charging of the samples. 

Soft X-ray absorption measurements are done at low-energy synchrotron X-ray facilities such as the UV ring at NSLS or the Advanced Photon Source (APS) at Lawrence Berkeley National Laboratory (LBNL). The beam size is typically 1 mm in diameter. The electron yield data are usually obtained in the total electron yield (EY) mode, measuring the current from a channel electron multiplier (Channeltron). Sometimes a voltage bias is applied to increase surface sensitivity. This is referred to as the partial electron yield (PEY) mode. Huorescence yield (EY) data are recorded using a windowless energy dispersive Si (Li) detector. The experiments are conducted in vacuum at a pressure of 2 X 10 torr. 

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