Oscillation of Anodic Oxide Thickness and Properties

Various surface analytical techniques have been used to investigate the changes in the physical and chemical properties of the oxide film during oscillation. 

FIGURE 5.55. Oscillation of oxide thickness along with current oscillation in 0.86M NH4CI + 0.1M NH4F + 0.04M NH4AC + 0.06 M HAc at pH 4.5 at 7V, . After Chazalviel et al (Reproduced by permission of The Electrochemical Society, Inc.) 

A number of models have been proposed for the mechanism of current oscillation on silicon electrode. A brief description of the major models is given below. 

---