Observation of plastic response

Free standing thin film of 99.99% pure Ag with strong 111 texture microtensile test at 20 ° C at strain rate of 1.1x10 0.2% offset yield strength. 5.8 5.8 ev270 

Venkatraman and Bravman (1992) estimated the yield strength of pure Al and Al-0.5% Cu thin films on Si substrates by performing substrate curvature measurements during the repeated application of a thermal cycle. A 

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