Nier-Johnson double-focusing

Nier-Johnson double-focusing mass analyzer. 

Figure 6. Schematic outline of the first commercially available multiple collector ICPMS, the Plasma 54, after Halhday et al. (1995). This instrument uses Nier-Johnson double-focusing and is equipped with eight independently adjustable Faraday collectors. The axial collector can be wound down to provide access to a Daly detector equipped with ion counting capabilities and a second-stage energy filter for high abundance sensitivity measurements. The sample may be introduced to the plasma source by either solution aspiration or laser ablation.

Figure 9.18 A Nier-Johnson double focus mass spectrometer. (From Ewing, used with permission.)...

Figure 9.20 A Nier-Johnson double-focusing mass spectrometer. (From Ewing, G.W., Mass spectrometry, in Ewing, G.W. (ed.). Analytical Instrumentation Handbook, 2nd edn., Marcei Dekker, inc.. New York, 1997. Used with permission.)...

Figure 2.13 Nier-Johnson double-focusing geometry. Reproduced with permission of Wiley-VCH Verlag GmbH from [8].

FIGURE 8.1 Schematic of a reverse Nier-Johnson double-focusing magnetic sector mass spectrometer (from U. Geismann and U. Greb, Fresnius Journal of Analytical Chemistry, 350,186-193, 1994). 

Figure 6.2. Nier-Johnson double-focusing mass spectrometer. The two sets of ion paths illustrate focusing for dispersion and for ion kinetic energy (shown in exaggerated form Ligon 1979). Modern commercial instruments give a resolving power of and mass measuring...

E.G. JOHNSON and A.O. NIER develop double-focusing instruments [30],... 

Fig. 1. Schematic diagram of a double-focusing Nier-Johnson magnetic sector mass spectrometer where ( " ) represents paths of ions having slightly...

The most recent metastable defocusing technique, which is referred to as mass-analyzed ion kinetic spectroscopy (MIKES) by Beynon (77, 270, 277) and as direct analysis of daughter ions (DADI) by Maurer (278) requires the interchange of the source and collector positions in a double-focusing mass spectrometer of Nier-Johnson geometry. With... 

Glow discharge ion source in Ar plasma Penning and e ionization plasma 3000-6000 ne 1015 cm-3 M+ low pressure double-focusing SFMS (reverse Nier-Johnson) traces, high-purity metals... 

Figure 3.5 Double-focusing sector field mass spectrometer with Nier-johnson geometry. (77. Kienitz (ed.), Massenspektrometrie (1968), Verlag Chemie, Weinheim. Reproduced by permission ofWiley-VCH)...

Figure 5.29 Instrumental setup of a radiofrequency (rf) glow discharge mass spectrometer by combining an ion source developed in house with a commercial double-focusing sector field mass spectrometer with reverse Nier-Johnson geometry (Element, Thermo Fisher Scientific, Bremen, Germany), (f S. Becker et al., IntJ. Mass Spectrom., 164, 81 (1997). Produced by permission of Elsevier.)...

Figure 16.5—Magnetic analyser mass spectrometer, a) Nier Johnson system, b) directional focusing properties of the magnetic field, c) principle of a double focusing mass spectrometer d) Mattauch-Herzog system.

Quads Paul et al. Double-Focus Nier-Johnson Time-of-Flight Stephens... 

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