Neutron and X-Ray Reflectometry

Thermal expansion of thin (130-5 nm) PHOST films coated on various substrates has been measured by using specular X-ray reflectivity [487]. Complementary use of neutron and X-ray reflectometry has allowed one to measure the spatial evolution of the reaction front in the fBOC resist with nanometer resolution [499]. Using a bilayer geometry with a lower layer consisting of PHOST protected with COO(CD3)3 and an upper layer consisting of PHOST containing PAG, compositional and density depth profiles were measured. 

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R. K. Thomas and J. Penfold, Neutron and X-ray Reflectometry of Interfacial Systems in Colloid and Polymer Chemistry, Curr. Opin. Coll. Interf Set, 1, 23 (1996). 

Vierheller T R, Forster M D, Schmidt A, Mathauer K, KnoU W, Wegner G, Satija S and Majkrzak C F (1994) Structure and thermal-stability of Langmuir-Blodgett-Kuhn layers of hairy-rod polymers probed with neutron and X-ray reflectometry, Macromolecules 27 6893-6902. 

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