Measurement of Melt Phase Diagrams

Melt phase diagrams can be determined using different methods of thermal analysis. Here, a substance is subjected to a controlled temperature program and a physical or physicochemical property of this substance is measured as a function of temperature. [Pg.46]

Optical properties (e.g. light TOA (thermomicroscopy (Kofler hot-stage method). [Pg.46]

Crystal lattice properties Temperature-resolved XRPD [Pg.46]

Coupled techniques are also possible allowing simultaneous measurement of the properties of interest, for example, XRPD-DSC or TG-DSC. [Pg.46]

thermooptical analysis DSC, differential scanning calorimetry TMDSC, temperature-modulated DSC Real, reaction calorimetry DTA, differential thermal analysis XRPD, X-ray powder diffraction TG, thermogravimetry. [Pg.46]