Mass Analyzers for FAB-MS

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The Development of Secondary lon-MS (SIMS) a Retrospective. Int. J. Mass Spectrom. Ion Proc. 1985, 66, 31-54. [Pg.404]

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Double-focusing magnetic sector instruments represent the standard in FAB-MS, because they combine a suitable mass range with the ability to perform high-resolution and accurate mass measurements. Until the advent of ESI and MALDI, FAB-MS/MS on magnetic four-sector instruments was the method of choice for [Pg.497]

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