Integrated NO microelectrodes

Insulation of the probe was insured by electrophoretic deposition of an anodic paint. The natural tendency of this kind of paint to retract upon curing resulted in the spontaneous exposure of the tip extremity, which formed an approximately hemispherical microelectrode characterized by a tip radius in the submicron range. In that sense, this hand-made probe was the first AFM-SECM probe integrating an actual (sub)-microelectrode. Again no electrochemical current images were recorded but contact mode AEM images allowed the electrochemically induced etch pits to be visualized (see Figure 21.4). 

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