In situ High-Pressure Setup

The conventional (UHV) XPS technique is a powerful tool to study surface composition and electronic states. However, these properties are strongly dependent 

Static lenses accepting electrons from a higher soHd angle [5, 6], By using a molecular beam directed towards a surface, relatively high local pressures (up to 10 mbar) can be achieved in front of a sample, while the base pressure of the analyzer chamber is stiU in the mbar range. Such experiments are carried 

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