Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

High-resolution SIM

As the monitored m/z values are selected to best represent the target compound, SIM exhibits high selectivity that can be further increased by high resolution SIM (HR-SIM) because this reduces isobaric interferences. [41-44] As HR-SIM requires precise and drift-free positioning on narrow peaks, one or several lock masses are generally employed although rarely explicitly mentioned. [44,45] The role of the lock mass is to serve as internal mass reference for accurate mass measurement. (Examples are given below.)... [Pg.479]

In order to independently confirm the actual In content and structural parameters, we performed high-resolution SIMS measurements. SIMS was carried out with a CAMECA IMS 4f-E6 system, employing Gs+ primary ions with an impact energy of 5.5 keV and InCs+ ions as species for detection. The depth resolution imder these conditions is about 1 nm/decade and 2 nm/decade at the leading and trailing edge, respectively. [Pg.142]

Figure 9.6. Scan functions for the SIM and high-resolution SIM inodes of operation for the XQIT. Only the (1) ion injection, (2) ion isolation, and (3) mass analysis steps are required. In this example a SOS-TWF is used during high q isolation step to ejected unwanted ions from the trap. The optional ion injection TWF has been turned off in this example. A frequency-domain spectrum (FFT) of the SOS-TWF reveals the notch in frequencies applied as shown in the inset. The resonance ejection amplitude is increased during mass analysis for optimum resolution. The multiplier is turned on during the mass analysis segment, step 4, to collect the ion signal. Figure 9.6. Scan functions for the SIM and high-resolution SIM inodes of operation for the XQIT. Only the (1) ion injection, (2) ion isolation, and (3) mass analysis steps are required. In this example a SOS-TWF is used during high q isolation step to ejected unwanted ions from the trap. The optional ion injection TWF has been turned off in this example. A frequency-domain spectrum (FFT) of the SOS-TWF reveals the notch in frequencies applied as shown in the inset. The resonance ejection amplitude is increased during mass analysis for optimum resolution. The multiplier is turned on during the mass analysis segment, step 4, to collect the ion signal.
Schumann E, Yang J C, RUhle M and Graham M J (1996), High resolution SIMS and analytical TEM evaluation of alumina scales on NiAl containing Zr or Y , Oxid... [Pg.78]


See other pages where High-resolution SIM is mentioned: [Pg.354]    [Pg.125]    [Pg.26]    [Pg.267]    [Pg.45]    [Pg.377]    [Pg.56]    [Pg.288]    [Pg.288]    [Pg.79]    [Pg.80]    [Pg.88]    [Pg.2872]    [Pg.2913]    [Pg.157]    [Pg.440]    [Pg.608]    [Pg.609]    [Pg.613]    [Pg.464]    [Pg.292]    [Pg.293]    [Pg.311]   
See also in sourсe #XX -- [ Pg.479 , Pg.480 ]

See also in sourсe #XX -- [ Pg.657 , Pg.662 ]




SEARCH



SIM

SIMS

© 2024 chempedia.info