HAADF mode High Angle Annular

Alternatively, images can be formed with electrons scattered at high angles (HAADF mode, for High Angle Annular Dark Field mode). An annular detector is placed below the sample and the focused electron beam is scanned over the sample. Interestingly, the contrast is not altered by diffraction phenomena and depends both the thickness and the composition (25). 

Fig. 3.14 Schematic set-up of an electron microscope in the transmission (TEM) (a) and combined (TEM and STEM) (b) modes. Note how the dark field detector is off the central axis, as the dark field image is based on scattered electrons. The HAADF-STEM operation mode with bright— (on the central axis) and dark-field detectors (of the central axis) is shown in (c). Two different modes are available for dark field imaging, i.e. annular dark field (ADF) high-angle annular dark field (HAADF). Figures modified after [37]. J. W Niemantsverdriet Spectroscopy in Catalysis An Introduction, pages 182 and 187. 2007. Copyright Wiley-VCH Verlag GmbH Co. KGoA. Reproduced with permission...

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