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Glancing angle X-ray diffraction GAXRD

Mineralogy The mineralogies were determined using glancing-angle X-ray diffraction (GAXRD, PAN-analytical X pert Materials Research Diffractometer, 45 kV, 40 mA). [Pg.52]


See other pages where Glancing angle X-ray diffraction GAXRD is mentioned: [Pg.208]    [Pg.161]    [Pg.203]    [Pg.63]    [Pg.208]    [Pg.161]    [Pg.203]    [Pg.63]   
See also in sourсe #XX -- [ Pg.208 , Pg.211 ]




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