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Gate oxide thickness, electronic devices

The thin films used in electronic device fabrication can have a thickness in the range of 0.02 am (200 A), which means that sub-micrometre particles can have a disastrous effect on device yields. In fact, particle generated pinholes in thin gate oxide films are one of the major causes of low yields in most integrated circuit production. [Pg.252]


See other pages where Gate oxide thickness, electronic devices is mentioned: [Pg.79]    [Pg.991]    [Pg.166]    [Pg.107]    [Pg.266]    [Pg.761]    [Pg.315]    [Pg.334]    [Pg.330]    [Pg.62]    [Pg.70]    [Pg.472]    [Pg.535]    [Pg.371]    [Pg.446]   
See also in sourсe #XX -- [ Pg.440 ]




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