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Fourier transform infrared microscopy advantages

Fourier spectroscopy, 23 137 Fourier transformation, essential equations for, 14 226-227 Fourier transform (FT) infrared (ftir) analysis, 19 563-564, 813. See also Microscopy-ftir technique dichroism, in silicone network characterization, 22 569 instruments, 23 138 advantages of, 14 228 resolution for, 14 227 microscopy, 14 232... [Pg.379]

The association of several techniques to study the same system is always advantageous. For the specific case of surfaces, techniques like XPS, contact angle, diffuse reflectance infrared with Fourier transform, surface area and pore size measurements, scanning electron microscopy appear frequently associated. This is the case for the study of carbon or glass fibers [ 105-109], activated carbons [110], and polymeric films obtained by plasma polymerization [111]. In Section 5, the specific combination of diffuse reflectance spectroscopies in the region of UVA is and XPS will be emphasized. [Pg.316]

See other pages where Fourier transform infrared microscopy advantages is mentioned: [Pg.95]    [Pg.386]    [Pg.179]    [Pg.353]    [Pg.146]    [Pg.26]    [Pg.390]    [Pg.368]    [Pg.252]    [Pg.224]    [Pg.88]    [Pg.160]    [Pg.525]    [Pg.536]   
See also in sourсe #XX -- [ Pg.3410 ]



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