Example Stress in compositionally graded films

The stress-free mean lattice garameter in the capping layer is estimated to be (0.88 X 5.653 A) - - (0.12 X 6.058A) = 5.702 A. The uniform mismatch strain in the capping layer, with respect to the substrate, is denoted by and is estimated to be 

by linear interpolation, the variation of mismatch strain through the thickness 

With the variation of modulus and mismatch strain known explicitly in (2.62) and (2.64), respectively, the values of Cm,n which are required for determining deformation according to (2.51) can be determined from (2.50) these are 

The magnitude of the equi-biaxial strain for any value of z in the structure is 

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