Electron-beam irradiation of grains

Transmission electron microscopy has been widely used for structural characterization of the irradiated microstmctures and is one of the primary techniques used for characterization of nano-sized defects in structural materials. These microscopes have been used for decades to characterize dislocations (size, density, type), voids, bubbles, and precipitates in materials, as well as grain sizes on the nanoscale and misorientalion of grain boundaries. In addition to imaging, semiquantitalive chemical compositions can be obtained using characteristic X-rays due to electron beam excitation. Electron diffraction provides structural information such as phases and ordering of the structure (amorphous versus crystalline). Improvements over the decades in... 

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