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Double-beam interference microscope

Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with the Double-Beam Interference Microscope. [Pg.660]

An elegant two-beam interference method, based on the action of a special double prism, is used in the interference accessory device according to Nomarski [18-20]. This device can be inserted in polarizing microscopes in vertical illumination. It enables a very rapid thickness determination especially of thicker films. [Pg.323]

See other pages where Double-beam interference microscope is mentioned: [Pg.855]    [Pg.317]    [Pg.855]    [Pg.317]    [Pg.145]    [Pg.440]    [Pg.23]    [Pg.162]   


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Double beam

Interference microscope

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