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Diffusion coefficient scanning electron microscopy

Radioactive tracers were utilized by Bueche (1962) to measure self diSusion coefficients for polymer systems above their glass-transition temperature, Tg. Price et al. (1978) described a novel approach that used scanning electron microscopy (SEM) and dispersive energy X-ray fluorescence analysis to measure the interdiffusion (D Kh cmVsec) of compatible polymer/polymer systems. Quasi-elastic light scattering (QELS) is an unusual technique due to its ability to measure both the mutual and self diffusion coefficients. Patterson et al. (1981) and Amis s. (1983) have demonstrated the apphcahon of this technique to polymeric gels. [Pg.155]

AES — Auger Electron Spectroscopy DLTS - Deep Level Transient Spectroscopy SEM - Scanning Electron Microscopy SIMS - Secondary Ion Mass Spectrometry D(c) - Concentration Dependent Diffusion Coefficient Maximum Diffusion Coefficient (f) - East Diffusion Component (i) - Interstitial Diffusion Component (s) - Slow Diffusion Component (II) - Parallel to c Direction (JL) - Perpendicular to c Direction... [Pg.2187]


See other pages where Diffusion coefficient scanning electron microscopy is mentioned: [Pg.509]    [Pg.267]    [Pg.64]    [Pg.360]    [Pg.1683]    [Pg.4]    [Pg.138]    [Pg.182]    [Pg.82]    [Pg.1197]    [Pg.204]    [Pg.160]    [Pg.77]    [Pg.355]    [Pg.371]    [Pg.4748]    [Pg.4747]    [Pg.293]    [Pg.560]   
See also in sourсe #XX -- [ Pg.154 , Pg.160 ]




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