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Dielectric sensing

In Situ Frequency Dependent Dielectric Sensing of Cure... [Pg.137]

In summary, dielectric sensing provides valuable insight in observing the state of the resin during the process, verifying and reducing the time in developing a cure process, as well as... [Pg.139]

Fagan, C.C., Everard, C., O Donnell, C.P. 2004. Prediction of moisture and salt content of cheese by dielectric sensing. Pro. ICEF9 Int. Congr. Engineering and Food, Montpellier, France, 7-11 March, 2004 (on CD). [Pg.774]

Hass, D.D. 1996. Dielectric Sensing of Ceramic Particle Suspensions. MS Thesis, University of Virginia. [Pg.774]

Hakme, C., Stevenson, L, Maazouz, A. et al. 2007. In situ monitoring of cyclic butylene terephthalate polymerization by dielectric sensing. J. Non-Cryst. Solids 353 4362 365. [Pg.345]

Dielectric cure monitoring generally relies on measin-ement of the ionic conductivity (a in eq. 19). The conductivity during cure of epoxy-amine systems have been characterized to establish relationships between conductivity and viscosity (103,104), conductivity and Tg (104), and relationships to the conversion of epoxide (103). Recently, models were established to relate changes in the dipole component of the complex permittivity to the advancement of cure through the Tg-con version relationship, expanding the capabilities of dielectric sensing to monitor cure (102). [Pg.8533]

Frequency dependent dielectric measurements made over many decades of frequency (Hz to MHz) provide a sensitive, convenient means for characterising processing properties of thermosets and thermoplastics [882]. DIES contributes to the understanding of the dynamics of complex solid polymer systems such as blends, of polymer solutions, and of polymerisation and curing or drying reactions. On-line in situ dielectric sensing is applied in monitoring the polymerisation step in the production of... [Pg.126]

Figure 2 Changes in the p-polarization component of a theoretical SPR spectrum generated with a CPWR device, comprising a silver layer coated with a 460 nm SiOz film, caused by alterations in either the refractive index (A), the thickness (B), or the extinction coefficient (C), of a light-absorbing dielectric sensing film deposited on the silica film. The incident and emerging media are both as described in Figure 1. Figure 2 Changes in the p-polarization component of a theoretical SPR spectrum generated with a CPWR device, comprising a silver layer coated with a 460 nm SiOz film, caused by alterations in either the refractive index (A), the thickness (B), or the extinction coefficient (C), of a light-absorbing dielectric sensing film deposited on the silica film. The incident and emerging media are both as described in Figure 1.

See other pages where Dielectric sensing is mentioned: [Pg.817]    [Pg.138]    [Pg.138]    [Pg.138]    [Pg.138]    [Pg.139]    [Pg.139]    [Pg.2250]    [Pg.123]    [Pg.124]    [Pg.125]    [Pg.127]   
See also in sourсe #XX -- [ Pg.138 ]




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