Diagnosis Techniques for Electrochemical Supercapacitors

In developing and ophmizing new ES materials and components (electrode materials, electrolytes, and current collectors) based on their structures, morphologies, and performance, physical characterization using sophisticated instrument methods serves as the necessary approach. These instrumental methods are scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), energy-dispersive X-ray spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS), Raman spectroscopy (RS), Fourier transform infrared spectroscopy (FTIR), and the Brunauer-Emmett-Teller (BET) technique. 

This chapter will introduce these techniques with a focus on their application for ES characterizations. 

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