Depth profiling angular dependence

Nondestructive depth profiling and surface heterogeneity assessment using (1) photoelectrons with differing escape depths and (2) angular-dependent ESCA studies... 

The angular dependence of the penetration depth allows depth profiling, but due to superposition of the contributions from different depths an analysis can be difficult. 

The dependence of the depth profiles, related directly to ion mixing as deduced above, on the ion energy and angle of incidence in Ge-Si specimens of various structures has also been studied, but since the angular dependence is rather weak, the results given are concerned only with the energy dependence of the mixing (20, 211. 

This illustrates the great importance of complementary studies with the differing photon sources as a means of depth profiling particularly for polymer surfaces of sanq)les in powder or fibre form for which routine angular dependent studies are not available. 

Let 0 be angular deflection of a dipole from the symmetry axis of the potential 1/(0), let p be a small angular half-width of the well (p Ci/2), and let (/0 be the well depth its reduced value u Uo/(kgT) is assumed to be 1. Since in any microscopically small volume a dipole moment of a fluid is assumed to be zero, we consider that two such wells with oppositely directed symmetry axes arise in the interval [0 < 0 < 2ji]. For brevity we consider now a quarter-arc of the circle. The bottom of the potential well is flat at 0 < 0 parabolic dependence U on 0. The form factor/is defined as the ratio of this flat-part width to the whole width of the well. Thus, the assumed potential profile is given by... 

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