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Contact angle hysteresis mechanism measurement

Table IV shows contact angle data for this PDMS film grafted onto silicon wafer. Note that these contact angles were measured in the conventional manner to allow a Zisman critical surface tension of wetting determination (aj to be made from the advancing -alkane and paraffin oil data. This is shown in Figure 1, a value of 22.7 mN/m being obtained. This surface exhibited small hysteresis and the value is gratifyingly close to the contact mechanics (Johnson, Kendall and Roberts approach) value of 22.6 mN/m (13). Note also that paraffin wax has a very similar value of 23 mN/m (3),... Table IV shows contact angle data for this PDMS film grafted onto silicon wafer. Note that these contact angles were measured in the conventional manner to allow a Zisman critical surface tension of wetting determination (aj to be made from the advancing -alkane and paraffin oil data. This is shown in Figure 1, a value of 22.7 mN/m being obtained. This surface exhibited small hysteresis and the value is gratifyingly close to the contact mechanics (Johnson, Kendall and Roberts approach) value of 22.6 mN/m (13). Note also that paraffin wax has a very similar value of 23 mN/m (3),...

See other pages where Contact angle hysteresis mechanism measurement is mentioned: [Pg.99]    [Pg.110]    [Pg.313]    [Pg.79]    [Pg.599]    [Pg.110]    [Pg.19]    [Pg.446]    [Pg.216]    [Pg.102]    [Pg.273]    [Pg.123]    [Pg.105]    [Pg.102]    [Pg.85]    [Pg.444]    [Pg.41]   
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