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Concentric hemispherical analyzer retardation

Fig. 5. Electronic equipment used to detect electron spectra (a) the cylindrical mirror analyzer (CMA) (b) Ae retarding potential analyzer (c) the concentric hemispherical analyzer (CHA). The electron gun is labeled as (1), the specimen (2). Fig. 5. Electronic equipment used to detect electron spectra (a) the cylindrical mirror analyzer (CMA) (b) Ae retarding potential analyzer (c) the concentric hemispherical analyzer (CHA). The electron gun is labeled as (1), the specimen (2).
An example of the arrangement of a single-stage CMA in a modem system for AES analysis is shown in Figure 32, taken from [128]. The double-pass CMA described in Section 27.2.2.4 (see Fig. 8) can also be used for AES by grounding the spherical retardation meshes and the inner cylinders and by setting the variable internal apertures to minimum. Although the double-pass CMA is not ideal for either AES or XPS, use of the same analyzer, in its different modes of operation, for both techniques is very convenient. Similarly, the concentric hemispherical analyzer... [Pg.876]


See other pages where Concentric hemispherical analyzer retardation is mentioned: [Pg.885]    [Pg.3825]    [Pg.3824]    [Pg.430]    [Pg.1009]    [Pg.162]    [Pg.615]    [Pg.72]    [Pg.71]   
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