Circumventing problems with inverted

As described here, these problems can be circumvented by "inverted" chemical force microscopy (CFM) [14], In inverted CFM, pull-off forces [15] between the tip coated with the reactant and an inert surface are monitored as a function of time (Figure 1). The contact area of the tip at pull-off in such experiments using non-reactive SAMs (as inert samples) deposited on Au(lll) varies between approximately 10-100 effectively interacting molecular pairs [16,17],... 

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