Chromium oxide layer, depth profile

Figure 9.10 Depth profile for a non-conducting chromium oxide layer on chromium based alloy measured by rf CDMS. (A. I. Saprykin, J. S. Becker et ai, Fresenius /. Anal. Chem., 358, 145 (1997). Reproduced by permission of Springer Science and Business Media.)...

Figure 14.33 Depth profile analysis of a Nichrome film on a silicon substrate. The outermost layer shows both Cr and oxygen, probably as a stable chromium oxide layer. The Ni and Cr (the Nichrome film) signals drop off at about 175 A while the Si substrate signal starts to appear, indicating the approximate film thickness. (From Weber.)...

The most relevant findings of the SIMS analyses as reported in the literature [12,38,39] are the depth profiles of chromium and their consistency with the trends of oxidation kinetics. The Cr depth profiles obtained after 52 hours of oxidation are presented in the Figures 8-10. At each of the oxidation temperatures, Cr content of the irmer layer of nanocrystaUine Fe-lOCr alloy was invariably found to be considerably higher than the highest Cr content in the inner layer of microcrystalline Fe-lOCr alloy. This provides an explanation for the greater oxidation resistance of the nanocrystaUine Fe-lOCr alloy (as shown in Figures 8-10), since oxidation resistance of Fe-Cr alloys is governed primarily by the Cr content of the thin oxide scale. 

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