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Chemical Analysis of Gelatin Films

The mechanical and physical properties of gelatin vary from each manufacturer due to its complex structure and the different sources it comes from. Thus, it is important to evaluate these properties of the gelatin used in the experiments for analysis of the composite properties. [Pg.38]

XPS is based on the photoelectric effect principle of the ejection of electrons from a surface when the photons impinged upon it. The source of photon energies used is A1 Ka. The energy of the photoelectrons leaving the surface of a specimen gives a spectrum with a series of photoelectron peaks in terms of binding energy [Pg.39]

These peaks can be used to detennine the composition of the specimen as well as the type of bonds that exist in the specimen. XPS, however, cannot detect the elements Hydrogen and Helium. [Pg.40]

Sample Atomic concentration % Calculated elemental ratio  [Pg.41]

4 Microstructural Examination of Silica Aerogels and Their Composites [Pg.43]


Chemical Analysis of Gelatin Films Table 4.1 Elemental composition of gelatin films... [Pg.41]


See other pages where Chemical Analysis of Gelatin Films is mentioned: [Pg.38]    [Pg.39]    [Pg.43]   


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