Carbon nanotubes image analysis

Ichimura T, Hayazawa N, Hashimoto M, Inouye Y, Kawata S (2004) Application of tip-enhanced microscopy for nonlinear Raman spectroscopy. Appl Phys Lett 84 1768 Ichimura T, Hayazawa N, Hashimoto M, Inouye Y, Kawata S (2004) Tip-enhanced coherent anti-stokes raman scattering for vibrational nanoimaging. Phys Rev Lett 92 220801 Tanaka S, Maeda Y, Cai L, Tabata H, Kawai T (2001) Application of tip-enhanced microscopy for nonlinear Raman spectroscopy. Jpn J Appl Phys 40 4217 Watanabe H, Ishida Y, Hayazawa N, Inouye Y, Kawata S (2004) Tip-enhanced near-field Raman analysis of tip-pressurized adenine molecule. Phys Rev B 69 155418 Yano T, Verma P, Saito Y, Ichimura T, Kawata S (2009) Pressure-assisted tip-enhanced Raman imaging at a resolution of a few nanometres. Nature Photon 3 473 Yano T, Inouye Y, Kawata S (2006) Nanoscale uniaxial pressure effect of a carbon nanotube bundle on tip-enhanced near-field Raman spectra. Nano Lett 6 1269 Downes A, Salter D, Elfick A (2006) Heating effects in tip-enhanced optical microscopy. Opt Exp 14 5216... 

Field emission from carbon nanotubes may be more complex than implied by the analysis above since, in contrast to metal tips, the Fermi wavelengths are comparable to the tip size and consequently electronic states exist, which extend over the entire tip [152,168]. Emission is therefore not from individual atoms but from these tip states such that the emission is coherent. The field emission patterns from individual MWNTs in fact carry the signature of coherent emission from the tip states [168] (see Fig. 36). SWNTs have been imaged as well and the patterns correspond with calculated nanotube charge densities [152]. 

Wang X, li N, Pfefferle LD, Haller GL. Metal nanoparticles inside multi-walled carbon nanotubes a simple method of preparation and of microscopic image analysis. Micropor Mesopor Mat 2013 176 139-44. 

T. Yano, P. Verma, S. Kawata, Y. Inouye, Diameter-selective near-field Raman analysis and imaging of isolated carbon nanotube bundles. Appl. Phys. Lett. 88,093125 (2006)... 

---