Calculations of Yield Curves

We have found examples of some of the shifts in yield maxima in our collection of data on UV-induced mutagenesis in the haploid yeast Sac-charomyces cerevisiae. The experimental procedures used in our laboratory have already been described in detail (albeit for other strains) elsewhere  

FIGURE 5. Survival, lys2 1 reversion yield, and frequency data for a haploid excision-defective strain radUl of the yeast S. cerevisiae. The maximum yield is expected to fall between LDs and 2 LDst (zone indicated by double arrow). The values of the coefficients of mutability and lethality used to fit the data were rrii = 4.50 X 10 m2 = 6.64 X lO ki = 0.36. 

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