Boundary element method , scanning

Fulian Q, Fisher A C and Denuault G 1999 Applications of the boundary element method in electrochemistry scanning electrochemical microscopy, part 2 J. Phys. Chem. B 103 4393... 

Demming, F., Jersch, J., Dickmatm, K.and Geshev. P. I. (1998) Calculation of the field enhancement on laser-illuminated scanning probe tips by the boundary element method. Appl. Rhys. B, 66, 593-598. 

Sklyar, O., Kueng, A., Kranz, C. et al. (2005) Numerical simulation of scanning electrochemical microscopy experiments with frame-shaped integrated atomic force microscopy-SECM probes using the boundary element method. Analytical Chemistry, 77, 764-771. 

Sklyar, O. and Wittstock, G. (2002) Numerical simulations of complex nonsymmetrical 3D systems for scanning electrochemical microscopy using the boundary element method. Journal of Physical Chemistry B, 106, 7499-7508. 

Fulian et al. [75] introduced the boundary element method (BEM) for the niunerical solution of SECM diffusion problems and showed that it is more suitable for problems with regions of complex or rapidly changing geometries than finite difference methods employed in earlier SECM publications. The BEM was used to simulate current responses for a nondisk tip approaching a flat substrate a disk-shaped tip over a hemispherical or a sphere-cap substrate, or a tilted substrate a lateral scan of a disk-shaped tip over an insulating/conductive boundary. 

Sklyar O, Trauble M, Zhao CA, Wittstock G. Modeling steady-state experiments with a scanning electrochemical microscope involving several independent diffusing species using the boundary element method. J Phys Chem B 2006 110 15869-15877. 

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