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Atomic force microscopy noncontact techniques

Atomic force microscopy (AFM) images are obtained by measuring the force created by the proximity of a sharp tip (mounted on a cantilever) to the surface sample. Different from STM, insulating tips and samples can be used in AFM. This technique allows three main image modes contact, noncontact, and intermittent contact [101]. [Pg.229]

See other pages where Atomic force microscopy noncontact techniques is mentioned: [Pg.311]    [Pg.2396]    [Pg.107]    [Pg.909]    [Pg.33]    [Pg.1079]    [Pg.473]    [Pg.329]    [Pg.449]    [Pg.901]   
See also in sourсe #XX -- [ Pg.204 ]



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