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Atomic force microscopy intermittent-contact mode

Atomic force microscopy (AFM) is a very useful technique to study the patterns exhibited at the surface of thin films. Used in taping mode, which exploits the interaction of the tip with the surface during intermittent contacts between... [Pg.87]

Atomic force microscopy (AFM) images are obtained by measuring the force created by the proximity of a sharp tip (mounted on a cantilever) to the surface sample. Different from STM, insulating tips and samples can be used in AFM. This technique allows three main image modes contact, noncontact, and intermittent contact [101]. [Pg.229]

IC-AFM intermittent contact mode in atomic force microscopy... [Pg.868]

See other pages where Atomic force microscopy intermittent-contact mode is mentioned: [Pg.595]    [Pg.482]    [Pg.407]    [Pg.311]    [Pg.112]    [Pg.131]    [Pg.132]    [Pg.615]    [Pg.136]    [Pg.506]    [Pg.393]    [Pg.278]    [Pg.140]    [Pg.142]    [Pg.223]    [Pg.287]    [Pg.656]    [Pg.329]    [Pg.252]    [Pg.166]    [Pg.145]   
See also in sourсe #XX -- [ Pg.312 ]



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