Electric double layer atomic force microscopy

Miyatani T, Florii M, Rosa A, Fu]ihira M and Marti O 1997 Mapping of electric double-layer force between tip and sample surfaces in water with pulsed-force-mode atomic force microscopy Appl. Phys. Lett. 71 2632... [Pg.1725]

RLA occurs when repulsive forces are stronger than attractive forces. In addition to the electrical double layer force, under certain conditions of pH and electrolyte concentration, a thin hydration layer develops around the particle surface and results in short-range hydration repulsion, which could cause a reduction in collision efficiency between particles and leads to slow aggregation kinetics [44, 45]. Based on empirical models derived from force-distance measurements using atomic force microscopy, Runkana et al. [24] derived the following expression for hydration... [Pg.265]