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Analysis depth in XPS

Fig. 17. The analysis depth in XPS varies as a function of the take-off angle or the angle between the sample surface and the direction in which the ejected electrons are propagating. Fig. 17. The analysis depth in XPS varies as a function of the take-off angle or the angle between the sample surface and the direction in which the ejected electrons are propagating.
See other pages where Analysis depth in XPS is mentioned: [Pg.4600]   
See also in sourсe #XX -- [ Pg.267 ]

See also in sourсe #XX -- [ Pg.267 ]



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