Amorphous short-range cluster

In conclusion, the effect of ion bombardment on amorphous Cr-O-Si layers is manifested in major surface chemical and short-range structural changes. Ar bombardment can be used to create chromium silicide clusters. To avoid such ion-beam-induced transformations, depth profiling by wet chemical etching may be preferable. 

However, one should not forget that fractal analysis gives only a common mathematic description of a polymer s structure, i.e., it does not identify those structural units (elements) that any real polymer consists of. The cluster model of polymer amorphous state structure allows one to obtain a physical description of a thermodynamically nonequilibrium polymer s structure with local (short-range) order representations drawing and molecular characteristics usage, which identifies its element quantitatively. Since these models consider polymer structure from different positions, they are a very good complement of one another [7, 29]. 

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