SEARCH Articles Figures Tables Atom Probe Studies of Semiconductor Materials Atom and Molecule Probes Atom probe Atom probe Atom probe atomic resolution Atom probe by inner-shell ionization Atom probe characteristics Atom probe configurations Atom probe field ion microscopy Atom probe field ion microscopy APFIM) Atom probe grain boundary analysis Atom probe interface analysis Atom probe microscopy Atom probe position sensitive detection Atom probe semiconductors Atom probe specimen preparation Atom probe surface reactions Atom probe thin films Atom probe tomography Atom probe tomography (APT) Atom probe tomography analysis Atom-probe field ion microscope Atomic Kelvin probe Atomic conducting probe Atomic force microscopy (AFM probe Atomic force microscopy colloidal probe Atomic force microscopy imaging probes Atomic force microscopy local mechanical properties probe Atomic force microscopy scanning probe instrument Atomic probe Atomic probe Atomic systems probe absorption interference Conducting-probe Atomic Force Microscopy Conductive-probe atomic force microscope Energy Compensated Atom Probe (ECAP) Field-Ion Microscopy and the Atom Probe Imaging atom-probe Local electrode atom probe Magnetic sector atom-probe Microscopy position-sensitive atom probe Position sensitive atom probe Position-sensitive Atom Probe (POSAP) Probe atomic force microscopy Probing using atomic force microscopy Pulsed laser atom probe Pulsed-laser time-of-flight atom-probe Scanning atom probe Scanning probe techniques atomic force microscopy The Conventional (One-Dimensional) Atom Probe Three-dimensional atom probe Time-of-flight atom probe Tomographic atom probe Wide-angle tomographic atom probe